About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
IEEE Trans Semicond Manuf
Paper
Trade-Offs in Cycle Time Management: Hot Lots
Abstract
In manufacturing, higher priority is given to hot lots to reduce their cycle time. The objective of this paper is to study the impact of hot lots on the cycle time of other lots in the system. Object-oriented simulation experiments of a wafer fabrication model were run to investigate the above impact. The simulation results showed that as the proportion of hot lots in the work-in-process increases both the average cycle time and the corresponding standard deviation for all other lots increase. Thus, it is argued that hot lots induce either a deterioration in service level for regular lots or an increase in inventory costs. Sound management accounting would require that these costs be estimated, possibly using an approach outlined herein. © 1992 IEEE