Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
A new lower bound for the mean code length of all one-to-one codes for a random variable with n outcomes is derived. The bound, which is tight, improves an earlier one due to Leung-Yan-Cheong and Cover. Another bound for one-to-one codes for binary information sources is derived. ©1982 IEEE
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Liqun Chen, Matthias Enzmann, et al.
FC 2005
Alessandro Morari, Roberto Gioiosa, et al.
IPDPS 2011
Bowen Zhou, Bing Xiang, et al.
SSST 2008