Threshold current as acceleration parameter for degradation of 980nm pump lasers

Abstract

The reliability of Er3+-doped fiber amplifiers using 980-nm semiconductor lasers shows very low level of random failures and very low degradation rates with only weak acceleration by temperature and by optical power. This paper describes the acceleration of the current-degradation rate observed with laser operation at higher threshold-current levels. Higher threshold current devices have been obtained either through selection within a standard population or through modification of the front-mirror reflectivity.