Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
The Scanning SQUID Microscope was used to measure the Josephson penetration length (λ J) along the grain boundary. The J c across the grain boundary was then derived from the λ J. YBa 2Cu 3O 7-x(YBCO) films were deposited on a special set of SrTiO 3 bicrystals to determine whether J cgb varies as function of boundary inclinations (α's). Our results showed that J cgb decreased with α, while α 2remained constant and vice-versa. The J cgb decreased exponentially with misorientation (θ). In addition, SEM studies showed that the boundaries meandered on the length scan of 0.5-2μm due to the island growth mode. The drop of J cgb with increasing α 1 and/or α 2, is more that what can be explained by either the d-wave symmetry of its superconducting order parameters or boundary meandering.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Frank Stem
C R C Critical Reviews in Solid State Sciences
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990