The problem of Sr doping and interface abruptness in La_2-xSr_xCuO₄ multilayers; the application of transmission electron microscopy

Abstract

This represents an attempt to use the local investigative properties of transmission electron microscopy to examine the content and distribution of strontium in La2-xSrxCuO4 thin films grown by molecular beam epitaxy on (001) strontium titanate substrates. © 1994.