Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
A theoretical approach in computing the index of a Morse function at a critical point on a real non-singular hypersurface V is given. As a consequence the Euler characteristic of V is computed. In the case where the hypersurface is polynomial and compact, a procedure is given that finds a linear function l, whose restriction l∣v, is a Morse function on V. © 1988, Hindawi Publishing Corporation. All rights reserved.
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Juliann Opitz, Robert D. Allen, et al.
Microlithography 1998
R.B. Morris, Y. Tsuji, et al.
International Journal for Numerical Methods in Engineering
R.A. Brualdi, A.J. Hoffman
Linear Algebra and Its Applications