Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
We completely classify one-sided Markov chains up to measure-theoretic isomorphism. The classification is effective and computable.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Matthew A Grayson
Journal of Complexity
Ligang Lu, Jack L. Kouloheris
IS&T/SPIE Electronic Imaging 2002
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000