PaperEffect of surface roughness on the critical velocities of superfluid He4K.W. SchwarzPhysical Review Letters
PaperLimits of strain relaxation in InGa/AsGaAs probed in real time by in situ wafer curvature measurementC. Lynch, E. Chason, et al.Journal of Applied Physics
PaperDislocation dynamics near film edges and corners in siliconK.W. Schwarz, D. ChidambarraoJournal of Applied Physics
PaperDislocation modeling for the silicon worldK.W. Schwarz, X.H. Liu, et al.Materials Science and Engineering: A
