PaperElectron heating in silicon nitride and silicon oxynitride filmsD.J. DiMaria, J.R. AbernatheyJournal of Applied Physics
PaperAtomic hydrogen-induced degradation of thin SiO2 gate oxidesE. Cartier, D.A. Buchanan, et al.Journal of Non-Crystalline Solids
PaperDirect measurement of the energy distribution of hot electrons in silicon dioxideS.D. Brorson, D.J. DiMaria, et al.Journal of Applied Physics
PaperDetection of impurities on silicon surfacesD.J. DiMaria, W. Reuter, et al.Journal of Applied Physics
