PaperOn the relationship between stress induced leakage currents and catastrophic breakdown in ultra-thin SiO2 based dielectricsD.A. Buchanan, J.H. Stathis, et al.Microelectronic Engineering
PaperInterface and bulk trap generation in metal-oxide-semiconductor capacitorsD.A. Buchanan, D.J. DiMariaJournal of Applied Physics
Conference paperNon-avalanche dielectric breakdown in wide-band-gap insulators at DC and optical frequenciesP. Braunlich, S.C. Jones, et al.SPIE Laser-Induced Damage in Optical Materials 1989