A. Gangulee, F.M. D'Heurle
Thin Solid Films
Photoemission measurements were performed on in-situ prepared amorphous TMxSn100 - x films (TM = Fe, Co, Ni, Pd). Valence band spectroscopy and core level analysis are in contradiction to the charge transfer model, often used to explain the magnetism and binding of transition metal/metalloid alloys. A comparison of valence-band spectra with theoretical density of states (DOS) curves indicates the existence of topological and chemical short-range order. Band structure calculations explain the stability of these alloys as being due to a hybridization pseudo-gap at the Fermi energy. A similar pseudo-gap is also expected within a nearly-free-electron model. © 1991.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
T.N. Morgan
Semiconductor Science and Technology
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999