P.C. Pattnaik, D.M. Newns
Physical Review B
The surface potential variations and the surface morphology of annealed (HfO 2) x(SiO 2) 1-x were investigated by noncontact atomic force microscopy (AFM) in ultrahigh vacuum. The study of the films focused on the compositional and structural characteristics of the phase separation alloy films using x-ray mediated techniques and far infrared spectroscopy. Additional modes of data acquisition included contact potential difference (CPD) and differential capacitance. CPD fluctuations were observed to have a local or fine structure component, which for the Hf-rich samples annealed at higher temperatures, correlated with the microstructure.
P.C. Pattnaik, D.M. Newns
Physical Review B
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
J.A. Barker, D. Henderson, et al.
Molecular Physics