Summary Abstract: The origin of oxidation induced enhancement of Si+ sputter yield in SIMS

Paper

01 Jan 1985

Summary Abstract: The origin of oxidation induced enhancement of Si⁺ sputter yield in SIMS

No abstract available.

Conference paper

S. Cohen, T.O. Sedgwick, et al.

MRS Proceedings 1983

Paper

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Surface Science

Review

David B. Mitzi

Journal of Materials Chemistry

Paper

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IEEE J-STARS