Summary Abstract: Scanning tunneling microscopy imaging and registration of the (v 3 x v3) R30° Ag/Si(111) surface

Joy Y. Cheng, Daniel P. Sanders, et al.

SPIE Advanced Lithography 2008

A. Nagarajan, S. Mukherjee, et al.

Journal of Applied Mechanics, Transactions ASME

Kafai Lai, Alan E. Rosenbluth, et al.

SPIE Advanced Lithography 2007

J. Paraszczak, J.M. Shaw, et al.

Micro and Nano Engineering