A. Rastelli, M. Stoffel, et al.
Microelectronics Journal
Review
Strain and the interpretation of band-lineup measurements
Abstract
A Comment on the Letter by T. M. Duc, C. Hsu, and J. P. Faurie, Phys. Rev. Lett. 58, 1127 (1987). © 1987 The American Physical Society.
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