Statistical calculation of dislocation movements in thin films

Abstract

A statistical method for calculating the effects of dislocation movements is described; the method is based on a realistic model although the effects of cross slip are not included. The long-range interactions between dislocations are considered to be limited by large intrinsic stresses and image stresses. The numerical results indicate that with sufficient time, about half of the dislocations are annihilated while the other half are bound in dipoles. The maximum strain is found to be almost independent of either the initial dislocation density or the initial dipole density. The calculated maximum strains are in fair agreement with the experimental data published by other investigators. © 1973 American Institute of Physics.