PaperSurface composition and chemistry of evaporated Permalloy films observed by x-ray photoemission spectroscopy and by Auger electron spectroscopyR.A. Pollak, C.H. BajorekJournal of Applied Physics
PaperCoverage of Si substrates by self-assembling monolayers and multilayers as measured by IR, wettability and X-ray diffractionM. Pomerantz, A. Segmüller, et al.Thin Solid Films
PaperTemperature- and composition-dependent valence mixing of Sm in cation-and anion-substituted SmS observed by X-ray photoemission spectroscopyR.A. Pollak, F. Holtzberg, et al.Physical Review Letters
Paper1T-TaS2 charge-density-wave metal-insulator transition and Fermi-surface modification observed by photoemissionR.A. Pollak, D.E. Eastman, et al.Physical Review B
