Conference paper
Generation of Stressmarks for Early Stage Soft-Error Modeling
Karthik Swaminathan, Ramon Bertran, et al.
DSN-S 2019
Review
Special series on harsh chips
Abstract
This introduction to the special series discusses the emerging field of harsh-environment-capable chips, or harsh chips. It also introduces the first two Harsh Chips articles in the issue.
Related
Marc Snir, Robert W. Wisniewski, et al.
IJHPCA
Cristobal Ortega, Lluc Alvarez, et al.
IEEE TC
Maico Cassel Dos Santos, Tianyu Jia, et al.
ICCAD 2022