F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
The critical current density of single-, bi-, and polycrystalline Y1Ba2Cu3O7 films has been imaged by low Temperature Scanning Electron Microscopy (LTSEM) with a spatial resolution of 1/μ. Our experiments directly show that grain boundaries limit the critical current density in polycrystalline films. Substantial variatoons of the critical current density have also been found in high quality, c-axis oriented epitaxial films, which have critical current densities above 1×106A/cm2 at 77K. © 1989.
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
A. Gangulee, F.M. D'Heurle
Thin Solid Films