Conference paper
Soft x-ray diffraction of striated muscle
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
The critical current density of single-, bi-, and polycrystalline Y1Ba2Cu3O7 films has been imaged by low Temperature Scanning Electron Microscopy (LTSEM) with a spatial resolution of 1/μ. Our experiments directly show that grain boundaries limit the critical current density in polycrystalline films. Substantial variatoons of the critical current density have also been found in high quality, c-axis oriented epitaxial films, which have critical current densities above 1×106A/cm2 at 77K. © 1989.
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
E. Burstein
Ferroelectrics
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
A. Gangulee, F.M. D'Heurle
Thin Solid Films