Jon Lee, Maxim Sviridenko, et al.
SIAM Journal on Computing
We present a practical approach to Anstreicher and Lee's masked spectral bound for maximum-entropy sampling, and we describe favorable results that we have obtained with a Branch-and-Bound algorithm based on our approach. By representing masks in factored form, we are able to easily satisfy a semidefiniteness constraint. Moreover, this representation allows us to restrict the rank of the mask as a means for attempting to practically incorporate second-order information. © Springer-Verlag 2007.
Jon Lee, Maxim Sviridenko, et al.
SIAM Journal on Computing
Cristiana Bragalli, Claudia D'Ambrosio, et al.
Optimization and Engineering
Jon Lee
IBM J. Res. Dev
Jon Lee, François Margot
INFORMS Journal on Computing