C.L. Platt, A.E. Berkowitz, et al.
Applied Physics Letters
Various spectroscopy, imaging, and scattering techniques exploit core-level resonances accessible in the soft X-ray energies to obtain magnetic information in thin films with elemental specificity. In this paper, we describe the emerging technique of resonant soft X-ray small-angle scattering (SAS) as a probe of magnetic and chemical variations in recording media on the nanometer scale. In particular, we characterize the grain size of a CoB-Pd multilayer media and magnetic and chemical grain sizes in perpendicular CoPtCr media.
C.L. Platt, A.E. Berkowitz, et al.
Applied Physics Letters
D. Bedau, H. Liu, et al.
DRC 2010
Wen Jiang, Gautam Khera, et al.
Journal of Applied Physics
Andreas Moser, David T. Margulies, et al.
Physical Review B - CMMP