J.P. Locquet, J. Perret, et al.
SPIE Optical Science, Engineering, and Instrumentation 1998
The soft-error resilience of the IBM POWER6™ processor I/O (input/ output) subsystem was measured using proton beam irradiation to accelerate the effect of single-event upsets. Test programs exercised each of the adapters on the chip. Error rates were measured for various cases ranging from idle to high I/O bandwidth and utilization. The POWER6 processor and I/O hub subsystem work together to maintain resiliency even under strenuous irradiation conditions. © Copyright 2008 by International Business Machines Corporation.
J.P. Locquet, J. Perret, et al.
SPIE Optical Science, Engineering, and Instrumentation 1998
Alessandro Morari, Roberto Gioiosa, et al.
IPDPS 2011
G. Ramalingam
Theoretical Computer Science
Elena Cabrio, Philipp Cimiano, et al.
CLEF 2013