Larry Wissel, Ethan H. Cannon, et al.
IEEE TNS
Experimental and modeling results are presented on the critical charge required to upset exploratory 65 nm silicon-on-insulator (SOI) circuits. Using a mono-energetic, collimated, beam of particles the charge deposition was effectively modulated and modeled. © 2006 IEEE.
Larry Wissel, Ethan H. Cannon, et al.
IEEE TNS
Ramachandran Muralidhar, Jin Cai, et al.
IEEE T-ED
Phil Oldiges, Kenneth P. Rodbell, et al.
IEEE International SOI Conference 2010
G. Tsutsui, Ruqiang Bao, et al.
IEDM 2016