K.Y. Ahn, S.R. Herd, et al.
JVSTA
We demonstrate here that bilayer films consisting of Si and transition metals with a layer thickness of 15-40 nm are promising materials for archival optical storage. They show a large optical reflectivity change before and after silicide formation, have a long lifetime at room temperature, and are nontoxic.
K.Y. Ahn, S.R. Herd, et al.
JVSTA
R.V. Joshi, L. Krusin-Elbaum, et al.
VLSI Technology 1985
L.J. Chen, K.N. Tu
Materials Science Reports
R.D. Thompson, K.N. Tu, et al.
Journal of Applied Physics