Liat Ein-Dor, Y. Goldschmidt, et al.
IBM J. Res. Dev
A method for discretizing the semiconductor transport equations using generalized mobility models is developed as an extension of the Scharfetter-Gummel finite difference approach. The method is sufficiently general to be applicable to nearly arbitrary empirical mobility models (including those for MOS surface effects) and may be used on a variety of mesh types in two or three dimensions. The impact of generalized mobility models on the sparsity of resulting discrete equations is discussed. Convergence rate of a Newton's method linearization of the nonlinear system of equations is measured and interpreted. Some computational results from a study of short-channel MOSFETs are presented to illustrate the approach.
Liat Ein-Dor, Y. Goldschmidt, et al.
IBM J. Res. Dev
B.K. Boguraev, Mary S. Neff
HICSS 2000
Thomas R. Puzak, A. Hartstein, et al.
CF 2007
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010