PublicationIEEE Circuits and Devices MagazinePaperScaling, Small Numbers and Randomness in SemiconductorsIEEE Circuits and Devices MagazineView publicationAbstractNo abstract available.Home↳ PublicationsDate01 Jan 1994PublicationIEEE Circuits and Devices MagazineAuthorsRobert W. KeyesIBM-affiliated at time of publicationShare