A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Paper
Scaling behavior in electrical transport across grain boundaries in YBa2Cu3O7- superconductors
Abstract
We have found that the product of the critical current and the resistance of a grain-boundary junction scale with the resistance of the boundary. This scaling is observed to hold for a variety of samples prepared by evaporation or laser ablation and whose critical current density varies by three orders of magnitude. © 1990 The American Physical Society.
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