Roughening and lower critical dimension in the random-field ising model

G. Grinstein; Shang-Keng Ma

doi:10.1103/PhysRevLett.49.685

Physical Review Letters

Paper

30 Aug 1982

Roughening and lower critical dimension in the random-field ising model

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Abstract

It is argued on the basis of a new interface model that the lower critical dimension of random-field Ising systems is two, in agreement with simple domain estimates. © 1982 The American Physical Society.

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Abstract

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