Roughening and lower critical dimension in the random-field ising model

G. Grinstein; Shang-Keng Ma

doi:10.1103/PhysRevLett.49.685

Physical Review Letters

Paper

30 Aug 1982

Roughening and lower critical dimension in the random-field ising model

View publication

Abstract

It is argued on the basis of a new interface model that the lower critical dimension of random-field Ising systems is two, in agreement with simple domain estimates. © 1982 The American Physical Society.

Paper

Suppression of tunneling by interference in half-integer-spin particles

Daniel Loss, David P. DiVincenzo, et al.

Physical Review Letters

Paper

Fundamental limits to magnetic-field sensitivity of flux-gate magnetic-field sensors

R.H. Koch, J.G. Deak, et al.

Applied Physics Letters

Paper

Phase structure of systems with multiplicative noise

G. Grinstein, M.A. Muñoz, et al.

Physical Review Letters

Paper

Integer quantum Hall transition: An alternative approach and exact results

Andreas W. W. Ludwig, Matthew P. A. Fisher, et al.

Physical Review B

View all publications

Abstract

Related

Suppression of tunneling by interference in half-integer-spin particles

Fundamental limits to magnetic-field sensitivity of flux-gate magnetic-field sensors

Phase structure of systems with multiplicative noise

Integer quantum Hall transition: An alternative approach and exact results