A. Gangulee, F.M. D'Heurle
Thin Solid Films
The frequency dependence of the current-current fluctuations is expressed in terms of energy-dependent amplitudes of the scattering matrix of the conductor. The frequency-dependent noise spectrum at equilibrium depends on the reflection amplitudes of the conductor. The theory is illustrated by considering a number of differing conductors with long-lived states. Special attention is paid to the case of a double-barrier structure in the presence of a current. © 1992 The American Physical Society.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Lawrence Suchow, Norman R. Stemple
JES
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering