Erich P. Stuntebeck, John S. Davis II, et al.
HotMobile 2008
In this paper we introduce a new testing concept called SnapShot. SnapShot is a testing mechanism which is composed of two components. The first component instruments the program with SnapShot statements which are used to produce a special trace during the program execution. The second component implements post processing on the trace. SnapShot implicitly defines a user defined coverage criteria and supports its implementation. We have applied snapshot to a variety of areas including serial, parallel and object oriented programs and VHDL designs.
Erich P. Stuntebeck, John S. Davis II, et al.
HotMobile 2008
Pradip Bose
VTS 1998
Raymond Wu, Jie Lu
ITA Conference 2007
Ehud Altman, Kenneth R. Brown, et al.
PRX Quantum