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PaperDefects in epitaxial multilayers. III. Preparation of almost perfect multilayersJ.W. Matthews, A.E. BlakesleeJournal of Crystal Growth
PaperStructure of thin lead oxide layers as determined by x-ray diffractionT.B. Light, J.M. Eldridge, et al.Journal of Applied Physics
PaperFracture of brittle epitaxial films under the influence of misfit stressJ.W. Matthews, E. KlokholmMaterials Research Bulletin
