Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Si 2p spectra collected from fluorinated Si(111)-7 × 7 are analyzed to determine whether chemical shifts induced by remote F atoms are discernible. Although the traditional interpretation adequately accounts for the observed chemical shifts without considering remotely induced shifts, recent experimental evidence indicates that such shifts may occur for highly electronegative adsorbates. Thus, an extended scheme is outlined that is consistent with all known data, but which includes remotely induced shifts. It is found that, although they differ quantitatively, both approaches yield the same qualitative results for fluorinated Si.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films