PaperExamining deep holes by rocking the beam in the scanning electron microscopeOliver C. WellsReview of Scientific Instruments
Conference paperThe early history and future of the SEMOliver C. Wells, David C. JoySurface and Interface Analysis
PaperComparison of different models for the generation of electron backscattering patterns in the scanning electron microscopeOliver C. WellsScanning
ReviewEffects of collector take‐off angle and energy filtering on the BSE image in the SEMOliver C. WellsScanning