Journal of Microscopy

Paper

02 Aug 2011

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

View publication

Abstract

No abstract available.

Related

Paper

Examining deep holes by rocking the beam in the scanning electron microscope

Oliver C. Wells

Review of Scientific Instruments

Conference paper

The early history and future of the SEM

Oliver C. Wells, David C. Joy

Surface and Interface Analysis

Paper

Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope

Oliver C. Wells

Scanning

Review

Effects of collector take‐off angle and energy filtering on the BSE image in the SEM

Oliver C. Wells

Scanning

View all publications