PaperDiscussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)Oliver C. WellsMicroscopy and Microanalysis
PaperMethod for measuring the field from a magnetic recording head in the scanning electron microscopeOliver C. WellsJournal of Microscopy
PaperMagnetically filtered low-loss scanning electron microscopyOliver C. Wells, Francoise K. LeGoues, et al.Applied Physics Letters
