PublicationJournal of MicroscopyPaperReduction of penetration effect at sharp edges in the scanning electron microscope (SEM)Journal of MicroscopyView publicationAbstractNo abstract available.Home↳ PublicationsDate02 Aug 2011PublicationJournal of MicroscopyAuthorsOliver C. WellsPhillip J. BaileyIBM-affiliated at time of publicationShare
