Journal of Microscopy

Paper

02 Aug 2011

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

View publication

Abstract

No abstract available.

Related

Review

Effects of collector take‐off angle and energy filtering on the BSE image in the SEM

Oliver C. Wells

Scanning

Conference paper

The history and future of the SEM - A personal view

Oliver C. Wells

M&M 2006

Paper

Low-loss electron images of uncoated photoresist in the scanning electron microscope

Oliver C. Wells

Applied Physics Letters

Paper

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

Oliver C. Wells

Journal of Microscopy

View all publications