Conference paperBetter on wafer performance and mask manufacturability of contacts with no or non-traditional serifsDonald Samuels, Ian StobertSPIE Photomask Technology + EUV Lithography 2007
Conference paperA reinforcement learning approach to production planning in the fabrication/fulfillment manufacturing processHeng Cao, Haifeng Xi, et al.WSC 2003
PaperClassification with nonmetric distances: Image retrieval and class representationDavid W. Jacobs, Daphna Weinshall, et al.IEEE Transactions on Pattern Analysis and Machine Intelligence
