Recording properties of patterned Co₇₀Pt₁₈Cr₁₂ perpendicular media

Recording properties of patterned and unpatterned media were evaluated using a static write/read tester. This instrument used a conventional giant magneto-resistance recording head in contact with the sample. Transition position jitter of patterned and unpatterned media was compared by writing square wave bit patterns on single island rows and narrow strips. It was found that patterning reduced jitter and analysis of the waveforms indicated more than 10x reduction.