Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Paper
Raman Spectroscopic Characterization and Molecular Force Field Development of a Synthetic Polyamide: Nylon 66
Abstract
No abstract available.
Related
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS