PublicationJournal of Applied PhysicsPaperPyrometric measurements of si, ge, and gaas wafers between 100°and 700°cJournal of Applied PhysicsView publicationAbstractNo abstract available.Home↳ PublicationsDate17 Jun 2004PublicationJournal of Applied PhysicsAuthorsF. JonaH.R. WendtIBM-affiliated at time of publicationShare
