Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
We have fabricated junctions and DC SQUIDs using laser ablation for both the YBCO electrodes and the thin SrTiO3(STO) barrier regions in a variety of device configurations. These SQUIDs operate reliably at 77 K and preliminary results on a limited number of devices show that they store reasonably well for periods in excess of one year, and exhibit only small changes with repeated cycles (~ 10) between room temperature and 77 K. Noise measurements made using bias reversing on a SQUID (92 pH) at 77 K give a white noise of about 15 µΦ•/√Hz and a 1/f upturn at about 0.2 Hz. © 1995 IEEE
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
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INFORMS 2021
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