Precision, double XTEM sample preparation of site specific Si nanowires

C.-K. Hu, L. Gignac, et al.

Microelectronics Reliability

C.-K. Hu, L. Gignac, et al.

JES

J.M.E. Harper, C. Cabral Jr., et al.

MRS Spring Meeting 1999

C.-K. Hu, L. Gignac, et al.

IITC 2002