Precision, double XTEM sample preparation of site specific Si nanowires

C.-K. Hu, L. Gignac, et al.

IITC 2007

Y.-H. Kim, C. Cabral Jr., et al.

IEDM 2005

C.-K. Hu, D. Canaperi, et al.

IRPS 2004

C.-K. Hu, L. Gignac, et al.

Journal of Applied Physics