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Nuclear Instruments and Methods
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Polycrystalline film target texture and nuclear backscattering analysis

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Abstract

The influence of target texture on the backscattering yield of 2 MeV 4He particles has been investigated for evaported thin-film targets of Nb, Ag, Au and Bi. The results have been correlated with those from X-ray diffraction. The implications of the texture found for nuclear-backscattering analysis are discussed, and it is suggested that backscattering may constitute a fast, quantitative method for investigations of texture in thin foils. © 1978.

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Nuclear Instruments and Methods

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