I.B. Ortenburger, S. Ciraci, et al.
Journal of Physics C: Solid State Physics
An experimental study of critical phenomena in thin ferroelectric films is presented which, for the first time, conclusively demonstrates that the polarization in thin films is drastically reduced as a result of depolarization effects. Other causes, like impurities, structural defects, and domain formation, which can lead to reduction of polarization, are ruled out. © 1973 The American Physical Society.
I.B. Ortenburger, S. Ciraci, et al.
Journal of Physics C: Solid State Physics
D.A. Liberman, I.P. Batra
The Journal of Chemical Physics
S. Ciraci, I.P. Batra
Solid State Communications
J.T. Jacobs, B.D. Silverman, et al.
IEEE Transactions on Sonics and Ultrasonics