Failure diagnosis with incomplete information in cable networks
Yun Mao, Hani Jamjoom, et al.
CoNEXT 2006
This paper reviews the charge-sensing optical probing system, and shows how it may be used to detect internal current and voltage signals in flip-chip-mounted silicon integrated circuits. Previously, researchers have used this concept to detect both single-shot 200-MHz-bandwidth signals, without averaging, and 8-GHz-bandwidth stroboscopic signals. This system has a high sensitivity: 145-nA/√Hz current sensitivity in typical bipolar transistors, and 1.35-mV/√Hz voltage sensitivity in typical CMOS circuits (using a semiconductor laser probe). It is noninvasive, has a potential submicron spatial resolution, and should be capable of providing linear and calibrated measurements. Therefore, this probing approach should be a powerful tool for future circuit analysis and testing.
Yun Mao, Hani Jamjoom, et al.
CoNEXT 2006
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Indranil R. Bardhan, Sugato Bagchi, et al.
JMIS
Ehud Altman, Kenneth R. Brown, et al.
PRX Quantum