Lawrence Suchow, Norman R. Stemple
JES
By placing a photon detector near the tip-sample region of a scanning tunneling microscope, we have measured isochromat photon-emission spectra of polycrystalline tantalum and Si(111)7×7 at photon energies of 9.5 eV. Such spectra contain electronic-structure information comparable to inverse photoemission spectroscopy, but with high lateral/spatial resolution. The implications of this new observation are discussed. © 1988 Springer-Verlag.
Lawrence Suchow, Norman R. Stemple
JES
Robert W. Keyes
Physical Review B
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
David B. Mitzi
Journal of Materials Chemistry