Conference paper
Structure of the silicon-oxide interface
Yuhai Tu, J. Tersoff
Thin Solid Films
A study was conducted to demonstrate that long-range interactions lead to surface phase coexistence over a range of temperature. Measurements of domain evolution for Si(111) show qualitative agreement with theory, and provide a measure of the latent heat of the transition.
Yuhai Tu, J. Tersoff
Thin Solid Films
P.C. Kelires, J. Tersoff
Physical Review Letters
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Physical Review Letters
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Physical Review Letters