Oxide-charge-induced impurity band in silicon inversion layers

K.N. Tu

Materials Science and Engineering: A

Elizabeth A. Sholler, Frederick M. Meyer, et al.

SPIE AeroSense 1997

Daniel J. Coady, Amanda C. Engler, et al.

ACS Macro Letters

U. Wieser, U. Kunze, et al.

Physica E: Low-Dimensional Systems and Nanostructures