PaperAuger and ellipsometric studies of ultra-thin PbO growth on leadN.J. Chou, J.M. Eldridge, et al.Journal of Electronic Materials
PaperAn internal calibration technique for pseudobinary systems by auger electron spectroscopyR. Hammer, N.J. Chou, et al.Journal of Electronic Materials
PaperX-ray photoelectron and infrared spectroscopy of microwave plasma etched polyimide surfacesN.J. Chou, J. Paraszczak, et al.Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperEffects of Insulator Thickness Fluctuations on MNOS Charge Storage CharacteristicsN.J. Chou, Joseph A. Aboaf, et al.IEEE T-ED
