C.C. Williams, H.K. Wickramasinghe
Optics Letters
Scanned-probe techniques are providing nanometer-resolution images of surface properties and surface features. In this contribution we suggest a technique identifying these features by locally recording their optical spectra. The technique is based on a simple modification to a scanning force microscope where an optical beam is focused onto the sample and the change in contact potential difference between tip and sample is measured as a function of laser wavelength. The change in contact potential difference can be due either to local heating or to a change in the surface dipole moment caused by optical excitation of sample and/or tip. Initial results of spectra and images of Au on mica and Cr are presented. © 1992.
C.C. Williams, H.K. Wickramasinghe
Optics Letters
D.W. Abraham, T.J. Chainer, et al.
INTERMAG 2003
Y. Martin, F. Zenhausern, et al.
Applied Physics Letters
P.C.D. Hobbs, Y. Martin, et al.
Proceedings of SPIE 1989