Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Paper
Opportunities for Watermarking Standards
Abstract
No abstract available.
Related
Erich P. Stuntebeck, John S. Davis II, et al.
HotMobile 2008
Robert C. Durbeck
IEEE TACON
Thomas M. Cover
IEEE Trans. Inf. Theory