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SPIE Photomask Technology + EUV Lithography 2007
It is shown that the line graph of the complete tripartite graph Kn,n,n is characterized by the spectrum of its adjacency matrix. © 1977, Taylor & Francis Group, LLC. All rights reserved.
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
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Proceedings of SPIE - The International Society for Optical Engineering
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