Conference paperNEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.S. Cohen, T.O. Sedgwick, et al.MRS Proceedings 1983
PaperSmall Signal Capacitance in Ferroelectric HZO: Mechanisms and Physical InsightsRevanth Kodoru, Atanu Saha, et al.arXiv
PaperEvidence for the heavy-fermion normal state of high-temperature superconductors from the theory of spectroscopyP.C. Pattnaik, D.M. NewnsPhysical Review B
Conference paperAnomalous interface degradation of a-Si:H TFTs during LCD lifetimeFrank R. Libsch, Takatoshi TsujimuraActive Matrix Liquid Crystal Displays Technology and Applications 1997
