Conference paper
Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Paper
On 72-widths inl00
Abstract
The n-width in L∞ of certain sets determined by matrices and integral operators is determined. The notion of total positivity is essential in the analysis. © 1977 American Mathematical Society.
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